Z. Dong, Z. Sun, X. Yang, X. Li, Y. Xue, C. Luo, P. Cai, Z. Wang, S. Wang, Y. Zhang, C. Wang, P. Ren, Z.G. Ji, X. Wu*, R. Wang, and R. Huang, "Catching the missing EM consequence in soft breakdown reliability in advanced FinFETs: impacts of self-heating, on-state TDDB, and layout dependence",2023 lEEE Symposium on VLSl Technology (VLSl),(2023). 集成电路顶会，集成电路学院首篇
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